Control Charts

A control chart is a time-ordered plot used in Statistical Process Control (SPC) to determine if a process is in statistical control. It distinguishes common-cause variation (inherent, random) from special-cause variation (assignable, requiring action) by comparing plotted statistics to 3-sigma control limits calculated from the process itself, not specifications. Principle: Form rational subgroups (small samples taken close in time so variation within subgroup is only common cause). Plot subgroup statistic over time with centerline = process average and UCL/LCL = centerline ± 3·σ_statistic. Variables charts for continuous data: X̄-R (mean and range, n=2-10, robust and simple), X̄-S (mean and standard deviation, n>10, more efficient than R), I-MR (individuals and moving range, n=1, for low-rate or destructive testing). X̄ monitors location, R/S/MR monitor dispersion; both must be in control. Attributes charts for discrete data: p-chart monitors proportion defective p = nonconforming/n (binomial model), np-chart monitors count nonconforming n·p (constant n), c-chart monitors count of defects per constant inspection unit (Poisson model), u-chart monitors defects per unit u = c/n when sample size varies. Key parameters: X̄̄ = grand mean, R̄ = average range, S̄ = average std dev, p̄ = average proportion, c̄ = average defects, ū = average defects per unit. Factors A2, D3, D4, B3, B4, E2 depend on n and link R̄ or S̄ to σ. Assumptions: rational subgrouping, measurement system adequate, for variables charts subgroup means ~ normal via CLT, for p/np binomial n·p̄≥5, for c/u Poisson with stable opportunity. Control limits are not spec limits or confidence intervals. Interpretation uses beyond-limits and Western Electric runs rules (e.g., 8 points on one side) to detect small shifts.

Governing FormulaVariables charts: X̄-R: Center = X̄̄, UCL_X̄ = X̄̄ + A2·R̄, LCL_X̄ = X̄̄ - A2·R̄; UCL_R = D4·R̄, LCL_R = D3·R̄ X̄-S: UCL_X̄ = X̄̄ + A3·S̄, LCL_X̄ = X̄̄ - A3·S̄; UCL_S = B4·S̄, LCL_S = B3·S̄ I-MR: I chart: Center = X̄, UCL = X̄ + E2·MR̄, LCL = X̄ - E2·MR̄; MR chart: UCL = D4·MR̄, LCL = D3·MR̄ Attributes charts: p-chart: p̄ = Σdefective/Σn, SE = √[p̄(1-p̄)/n], UCL/LCL = p̄ ± 3·SE np-chart: n·p̄, UCL/LCL = n·p̄ ± 3·√[n·p̄(1-p̄)] (constant n) c-chart: c̄ = total defects/k, UCL/LCL = c̄ ± 3·√c̄ u-chart: ū = Σc/Σn, UCL/LCL = ū ± 3·√(ū/n) (n may vary)

Knowledge Check

10 Questions

1.Which control chart is used for monitoring the process mean?

2.A p-chart is used for:

3.What is the purpose of an R-chart?

4.Which control chart is used for count of defects per unit?

5.What is the difference between a c-chart and a u-chart?

6.The np-chart is similar to the p-chart but uses:

7.In an X̄-R chart, the X̄ chart monitors:

8.What is the I-MR chart used for?

9.Which chart combination is most sensitive to small sustained shifts in the process mean?

10.The control limits for a p-chart are calculated as: